HAST Test Chamber: used for IC packaging, semiconductors, microelectronic chips, magnetic materials and other electronic components to conduct accelerated life reliability tests such as high voltage, high temperature, unsaturated/saturated humidity and heat.
HAST Test Chamber, also known as HAST High-voltage Accelerated Life Aging Test Chamber, is used for automotive-grade chips, IC packaging, semiconductors, microelectronic chips, magnetic materials and other electronic components to perform high-voltage, high-temperature, unsaturated/saturated damp heat and other accelerated life reliability tests. It is used in the product design stage to quickly expose product defects and weak links and test the sealing and aging performance of its products.
Application areas:
PCB, LCD Board, battery, capacitor, resistor, IC semiconductor, connector, circuit board, magnetic material, polymer material, EVA, photovoltaic module, automotive grade chip...
Product Features:
1. The inner chamber features a double-layer arc design to prevent condensation and dripping during testing, thus protecting the product from direct impact from superheated steam during testing, which could affect test results.
2. The product meets JESD22-A100 to A118 biased (BHAST) or unbiased (UHAST) accelerated humidity resistance tests, as well as saturated high-pressure steam (cooking) tests.
3. The product is compatible with the highly accelerated temperature and humidity stress (HAST) aging test and the high-pressure cooking (PCT) humidity resistance test.
4. A rapid exhaust mode allows for cool air to be exhausted before testing; during testing, the cool air exhaust design (exhausting air from the test chamber) improves pressure stability and reproducibility.
5. Optional bias terminals are available to meet different test requirements, with terminal counts ranging from 4 to 128 to cover most sample bias tests.
