BHAST Chamber This method is used to evaluate the operational reliability of non-hermetically sealed IC devices (solid-state components) under high temperature and humidity conditions, and performs accelerated stress aging tests under temperature, humidity, and bias conditions for chips, semiconductors, and other electronic components.
Test standard
AEC Q101 (Automotive Grade IC)
JIS C0096-2
GB/T2423.40-1997 Environmental Testing of Electrical and Electronic Products - Part 2: Test Methods - Section Cx: Constant Humid Heat (Unsaturated High-Pressure Steam)
IEC60068-2-66-1994 Environmental Testing - Part 2-66: Test Methods - Test Cx: Steady-State Humid Heat
JESD22-A100 Temperature and Humidity Bias Life Test (Cyclic)
JESD22-A101 Steady-State Temperature, Humidity/Bias Life Test (Temperature, Humidity, Bias Life Test)
JESD22-A102 High Pressure Steam Test (Accelerated Moisture Resistance)
JESD22-A108 Temperature, Bias Voltage, and Operating Life
JESD22-A110 HAST (Highly Accelerated Temperature Humidity Stress Test)
Application areas:
PCB, LCD board, battery, capacitor, resistor, IC semiconductor, connector, circuit board, magnetic material, polymer material, EVA, photovoltaic module, automotive-grade chip
Product features:
1. The inner chamber features a double-layer, curved design, preventing condensation and dripping, thus ensuring that the product is not subjected to direct impact from superheated steam during testing, which could affect the results.
2. An efficient vacuum pump maintains optimal pure saturated steam conditions inside the chamber.
3. Equipped with a 7-inch full-color touchscreen, 250 programmable cycles with 12,500 segments each, USB data download function, and an RS-485 communication interface.
4. Automotive-grade silicone sealing strip for excellent airtightness and durability.
5. Automatic water replenishment function with a front-mounted water level indicator.
6. Uses a dry-bulb/wet-bulb sensor for direct measurement (control modes include: dry-bulb, unsaturated, and saturated humidity).
