Linear Rapid Temperature Change Test Chamber：Used to test product performance under rapid temperature changes and extreme temperature conditions. Suitable for adaptability testing of complete electronic and electrical products and components under rapid or gradual temperature changes, especially for Environmental Stress Screening (ESS) testing of electronic and electrical products.
Suitable for environmental stress screening (ESS) testing of electronic and electrical products, as well as temperature stress detection of test pieces under rapid or gradual temperature changes, temperature and humidity screening, reliability testing, performance testing, weathering testing, and high and low temperature storage. Common temperature ramp rates include 5°C/min, 10°C/min, 15°C/min, 20°C/min, and 25°C/min.
Application areas:
Semiconductor chips, scientific research institutions, quality inspection, new energy, optoelectronic communications, aerospace and military industry, automobile industry, LCD display, medical and other technology industries.
Test standards:
GB/T 2423.1 Low Temperature Test Method, GJB 150.3 High Temperature Test Method, GB/T 2423.2 High Temperature Test Method, GJB 150.4 Low Temperature Test, GB/T2423.34 Humidity Cycle Test Method, GJB 150.9 Humidity Test Method, IEC60068-2 Temperature and Humidity Test Method, MIL-STD-202G-103B Humidity Test
Product features:
1. The product meets both linear and nonlinear temperature ramping requirements.
2. It meets temperature ramp rate requirements of 5°C/min to 30°C/min.
3. Optional features include liquid nitrogen, moist heat, and anti-condensation.
4. Utilizing electronic expansion valve technology and an innovative control system, the product achieves energy savings exceeding 45%.
