WBE-KSH1000/Rapid Temperature Change Test Chamber

Rapid Temperature Change Test Chamber:With the continuous development of reliability, companies hope to find potential product defects as quickly as possible or transition to stability as quickly as possible before shipment. Therefore, rapid temperature change testing is being adopted by more and more companies. Due to the limitations of mechanical refrigeration, it is difficult to achieve faster cooling rates. Therefore, liquid nitrogen (LN2) refrigeration is increasingly used. Test chambers using liquid nitrogen refrigeration are called high-acceleration rapid temperature change testing machines.

The test piece can be subjected to temperature stress (ESS) testing, temperature and humidity screening, reliability testing, etc. Commonly used temperature ramp rates are 5°C/min, 10°C/min, 15°C/min, 20°C/min, and 25°C/min.

Application areas:

Semiconductor chips, scientific research institutions, quality inspection, new energy, optoelectronic communications, aerospace and military industry, automobile industry, LCD display, medical and other technology industries.

Test standards:

GB/T 2423.1 Low Temperature Test Method, GJB 150.3 High Temperature Test Method, GB/T 2423.2 High Temperature Test Method, GJB 150.4 Low Temperature Test, GB/T2423.34 Humidity Cycle Test Method, GJB 150.9 Humidity Test Method, IEC60068-2 Temperature and Humidity Test Method, MIL-STD-202G-103B Humidity Test Method

Product features:

1. The product meets both linear and nonlinear temperature ramping requirements.
2. It meets temperature ramp rate requirements of 5°C/min to 30°C/min.
3. Optional features include liquid nitrogen, moist heat, and anti-condensation.
4. Utilizing electronic expansion valve technology and an innovative control system, the product achieves energy savings exceeding 45%.